This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. Topics covered include testing and inference, nonparametric inference, the point process approach, dynamic perturbed systems, and more.
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This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. Topics covered include testing and inference, nonparametric inference, the point process approach, dynamic perturbed systems, and more.
Read Less
Add this copy of Advances in Degradation Modeling: Applications to to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2009 by Birkhauser.
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