I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to thank Harold Brown for introducing me to the application of artificial intelligence to reasoning about designs, and his many valuable comments as a reader of this thesis. Significant contribu- tions by the other members of my ...
Read More
I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to thank Harold Brown for introducing me to the application of artificial intelligence to reasoning about designs, and his many valuable comments as a reader of this thesis. Significant contribu- tions by the other members of my reading committee, Mark Horowitz, and Allen Peterson have greatly improved the content and organization of this thesis by forcing me to communicate my ideas more clearly. I am extremely grateful to the other members of the Logic Group at the Heuristic Programming Project for being a sounding board for my ideas, and providing useful comments. In particular, I would like to thank Matt Ginsberg, Vineet Singh, Devika Subramanian, Richard Trietel, Dave Smith, Jock Mackinlay, and Glenn Kramer for their pointed criticisms. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence). I am grateful to Peter Hart, the former head of the AI lab, and his successor Marty Tenenbaum for providing an excellent environment for performing this research.
Read Less
Add this copy of An Artificial Intelligence Approach to Test Generation to cart. $14.00, very good condition, Sold by Common Crow Books rated 5.0 out of 5 stars, ships from Pittsburgh, PA, UNITED STATES, published 1987 by Kluwer Academic.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Near Fine. No Jacket. 1987, First edition. 193 pp. Hardcover, 8vo., glossy white covers. Near Fine copy, covers show light soil. Clean, unmarked text. No DJ.
Add this copy of An Artificial Intelligence Approach to Test Generation to cart. $82.30, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1987 by Springer.
Add this copy of An Artificial Intelligence Approach to Test Generation to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2011 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Print on demand Trade paperback (US). Glued binding. 194 p. Contains: Unspecified. The Springer International Engineering and Computer Science, 19.
Add this copy of An Artificial Intelligence Approach to Test Generation to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1987 by Springer.
Add this copy of An Artificial Intelligence Approach to Test Generation to cart. $139.10, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 2011 by Springer.
Add this copy of An Artificial Intelligence Approach to Test Generation to cart. $139.10, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 1987 by Springer.
