Summarizes major issues and gives reviews of important measurement techniques that are crucial to the advances in semiconductor technology. This book covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics.
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Summarizes major issues and gives reviews of important measurement techniques that are crucial to the advances in semiconductor technology. This book covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics.
Read Less
Add this copy of Characterization and Metrology for Ulsi Technology 2005 to cart. $49.95, fair condition, Sold by Goodwill of Silicon Valley rated 5.0 out of 5 stars, ships from San Jose, CA, UNITED STATES, published 2005 by American Inst. of Physics.
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Fair. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing page and cover creases as well as other types visible wear such as cover tears discoloration staining marks scuffs etc. All pages intact.