This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
Read More
This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
Read Less
Add this copy of 1998 International Symposium on Defect and Fault to cart. $100.99, very good condition, Sold by Alien Bindings rated 5.0 out of 5 stars, ships from BALTIMORE, MD, UNITED STATES, published 1998 by Institute of Electrical & Electronics Engineers.
Edition:
1998, Institute of Electrical & Electronics Engineers(IEEE)
Publisher:
Institute of Electrical & Electronics Engineers(IEEE)
Published:
1998
Language:
English
Alibris ID:
16749630271
Shipping Options:
Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Very good. Ex research library book. The rear cover is lightly scuffed. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge. 325 pages.
