Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly ...
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Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex, and demand components of the highest possible quality. Testing in general, and defect-oriented testing in particular, help in realizing these objectives.
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Add this copy of Defect Oriented Testing for Cmos Analog and Digital to cart. $7.99, very good condition, Sold by HPB-Emerald rated 4.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1997 by Springer.
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Add this copy of Defect Oriented Testing for Cmos Analog and Digital to cart. $137.54, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1997 by Springer.
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Seller's Description:
Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!