This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test ...
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This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.
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Add this copy of Design-for-Test and Test Optimization Techniques for to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2013 by Springer International Publishing AG.
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New. Contains: Illustrations, black & white, Illustrations, color. XVIII, 245 p. 133 illus., 115 illus. in color. Intended for professional and scholarly audience.
Add this copy of Design-for-Test and Test Optimization Techniques for to cart. $132.45, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 2013 by Springer International Publishing AG.
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Seller's Description:
New. Contains: Illustrations, black & white, Illustrations, color. XVIII, 245 p. 133 illus., 115 illus. in color. Intended for professional and scholarly audience.
Add this copy of Design-for-Test and Test Optimization Techniques for to cart. $134.59, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2013 by Springer.
Add this copy of Design-for-Test and Test Optimization Techniques for to cart. $177.90, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2013 by Springer.
