Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without ...
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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Add this copy of Design for at-Speed Test, Diagnosis and Measurement to cart. $13.52, very good condition, Sold by ThriftBooks-Reno rated 4.0 out of 5 stars, ships from Reno, NV, UNITED STATES, published 1999 by Springer.
Add this copy of Design for at-Speed Test, Diagnosis and Measurement to cart. $13.53, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1999 by Springer.
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Add this copy of Design for at-Speed Test, Diagnosis and Measurement to cart. $17.52, good condition, Sold by Goodwill of Silicon Valley rated 5.0 out of 5 stars, ships from San Jose, CA, UNITED STATES, published 1999 by Springer.
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Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing page and cover creases as well as other types visible wear.
Add this copy of Design for at-Speed Test, Diagnosis and Measurement to cart. $17.52, fair condition, Sold by Goodwill of Silicon Valley rated 5.0 out of 5 stars, ships from San Jose, CA, UNITED STATES, published 1999 by Springer.
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Fair. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing page and cover creases as well as other types visible wear such as cover tears discoloration staining marks scuffs etc. All pages intact.
Add this copy of Design for at-Speed Test, Diagnosis and Measurement to cart. $29.95, like new condition, Sold by Satellite Books rated 5.0 out of 5 stars, ships from Burlington, VT, UNITED STATES, published 1999 by Springer.
Add this copy of 1990 Hc Design for at-Speed Test, Diagnosis and to cart. $36.12, very good condition, Sold by Miki Store rated 4.0 out of 5 stars, ships from SAN JOSE, CA, UNITED STATES, published 1999 by Springer.
Add this copy of Design for at-Speed Test, Diagnosis and Measurement to cart. $43.98, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1999 by Springer.
Add this copy of Design for at-Speed Test, Diagnosis and Measurement to cart. $62.55, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1999 by Springer.
