This Reprint continues to showcase the advances of electron diffraction (ED) and structural imaging as powerful methods for structural science. Enabled by Cs correctors, direct detection cameras, beam precession, 4DSTEM, and 3DED, these approaches now resolve structures of nanocrystals, beam-sensitive compounds, and complex systems that are inaccessible to conventional X-ray methods. The second volume brings together nine contributions spanning organic charge-transfer co-crystals, graphene bilayers, chiral MOFs, amorphous ...
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This Reprint continues to showcase the advances of electron diffraction (ED) and structural imaging as powerful methods for structural science. Enabled by Cs correctors, direct detection cameras, beam precession, 4DSTEM, and 3DED, these approaches now resolve structures of nanocrystals, beam-sensitive compounds, and complex systems that are inaccessible to conventional X-ray methods. The second volume brings together nine contributions spanning organic charge-transfer co-crystals, graphene bilayers, chiral MOFs, amorphous silica films, perovskite thin films, additively manufactured alloys, lithium-ion cathodes, and zeolites. Featured studies include the precession-assisted 3DED of donor-acceptor systems, orientation mechanisms in graphene layers, absolute structural determination and enantiomorph distinction in chiral frameworks, and precession and energy-filtering effects on electron reduced density function analysis of amorphous materials. Methodological advances highlight scanning precession electron tomography for structural analysis of thin-film regions down to 10 nm and best practices for 3DED workflows, while applications address grain boundary engineering in AlSi10Mg alloys, cathode-electrolyte interphase formation in NMC811, and the first complete structure determination of zeolite ECR-1.
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Add this copy of Electron Diffraction and Structural Imaging II to cart. $53.63, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2025 by Mdpi AG.
Add this copy of Electron Diffraction and Structural Imaging II to cart. $55.54, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2025 by Mdpi AG.
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Fine. Sewn binding. Cloth over boards. 132 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Electron Diffraction and Structural Imaging II to cart. $55.79, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2025 by Mdpi AG.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Sewn binding. Cloth over boards. 132 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
