These proceedings focus on the physical basis and underlying theory of electron optics and analysis. The theme of the conference was advances in images and analysis with electrons and other focussed probes. Topics covered included conventional electron optics and analysis, secondary ion mass spectroscopy, scanning Auger spectroscopy, x-ray microscopy, acoustic microscopy and lithography.
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These proceedings focus on the physical basis and underlying theory of electron optics and analysis. The theme of the conference was advances in images and analysis with electrons and other focussed probes. Topics covered included conventional electron optics and analysis, secondary ion mass spectroscopy, scanning Auger spectroscopy, x-ray microscopy, acoustic microscopy and lithography.
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Add this copy of Electron Microscopy and Analysis 1987: Proceedings of to cart. $14.50, very good condition, Sold by The Book Bin rated 5.0 out of 5 stars, ships from Salem, OR, UNITED STATES, published 1988 by CRC Press.
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Very Good. > Edition/Printing: First edition | Used-VG+ cond. Ex-company lib (HP), labels to front cover, lower spine, chargeout slip to FFEP. Name stamps to edges. Small inked note to title page at spine. 361 pp. Proceedings of the Inst. of Physics Electron Microscopy and Analysis Group conference held at UMIST, 8-9 Sept. 1987. Over 83 papers > Language: English | > Size: 8vo-over 7 3/4-9 3/4 tall | > Media/Binding: Hardcover |
Add this copy of Electron Microscopy and Analysis 1987: Proceedings of to cart. $37.20, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1988 by CRC Press.
Add this copy of Electron Microscopy & Analysis, 1987 (Institute of to cart. $57.49, like new condition, Sold by Mahler Books rated 5.0 out of 5 stars, ships from Pflugerville, TX, UNITED STATES, published 1988 by Institute Of Physics Publishing.
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Add this copy of Electron Microscopy & Analysis, 1987 (Institute of to cart. $89.18, new condition, Sold by Mahler Books rated 5.0 out of 5 stars, ships from Pflugerville, TX, UNITED STATES, published 1988 by Institute Of Physics Publishing.
Add this copy of Electron Microscopy and Analysis: Conference to cart. $93.22, new condition, Sold by Books International rated 3.0 out of 5 stars, ships from Toronto, ON, CANADA, published 1988 by CRC Press.
Add this copy of Electron Microscopy and Analysis, 1987 to cart. $10.00, very good condition, Sold by P C Schmidt Bookseller rated 3.0 out of 5 stars, ships from Kettering, OH, UNITED STATES, published 1987 by IOP Publishing.
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Very Good. Ex-Library. 6 x 9" A very good hardcover; an ex-library copy with usual markings; internally pages bright and clean; ----------SATISFACTION GUARANTEED---------FAST, COURTEOUS SERVICE------ALL ORDERS SHIPPED WITH DELIVERY CONFIRMATION;