These proceedings focus on the physical basis and underlying theory of electron optics and analysis. The theme of the conference was advances in images and analysis with electrons and other focussed probes. Topics covered included conventional electron optics and analysis, secondary ion mass spectroscopy, scanning Auger spectroscopy, x-ray microscopy, acoustic microscopy and lithography.
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These proceedings focus on the physical basis and underlying theory of electron optics and analysis. The theme of the conference was advances in images and analysis with electrons and other focussed probes. Topics covered included conventional electron optics and analysis, secondary ion mass spectroscopy, scanning Auger spectroscopy, x-ray microscopy, acoustic microscopy and lithography.
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Add this copy of Electron Microscopy & Analysis, 1987 (Institute of to cart. $89.18, new condition, Sold by Mahler Books rated 5.0 out of 5 stars, ships from Pflugerville, TX, UNITED STATES, published 1988 by Institute Of Physics Publishing.
