Balancing its coverage of theory with a wide range of application areas, this handbook provides a complete guide to understanding, designing, and using high resolution instrumentation. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources.
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Balancing its coverage of theory with a wide range of application areas, this handbook provides a complete guide to understanding, designing, and using high resolution instrumentation. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources.
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Add this copy of Handbook of Charged Particle Optics to cart. $287.66, new condition, Sold by Booksplease rated 4.0 out of 5 stars, ships from Southport, MERSEYSIDE, UNITED KINGDOM, published 2008 by CRC Press.
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Seller's Description:
New. Glued binding. Paper over boards. 686 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Halftones, black & white, Tables, black & white, Figures.
Add this copy of Handbook of Charged Particle Optics, Second Edition to cart. $703.46, new condition, Sold by GridFreed rated 5.0 out of 5 stars, ships from North Las Vegas, NV, UNITED STATES, published 2008 by CRC Press.
Add this copy of Handbook of Charged Particle Optics to cart. $63.16, good condition, Sold by Anybook rated 4.0 out of 5 stars, ships from Lincoln, UNITED KINGDOM, published 1997 by Crc Press.
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This is an ex-library book and may have the usual library/used-book markings inside. This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 1250grams, ISBN: 9780849325137.
Add this copy of Handbook of Charged Particle Optics to cart. $79.39, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1997 by CRC-Press.