This book comprehensively describes high-resolution microwave imaging and super-resolution information processing technologies and discusses new theories, methods and achievements in the high-resolution microwave imaging fields. Its chapters, which include abundant research results and examples, systematically summarize the authors' main research findings in recent years. The book is intended for researchers, engineers and postgraduates in the fields of electronics systems, signal information processing and data ...
Read More
This book comprehensively describes high-resolution microwave imaging and super-resolution information processing technologies and discusses new theories, methods and achievements in the high-resolution microwave imaging fields. Its chapters, which include abundant research results and examples, systematically summarize the authors' main research findings in recent years. The book is intended for researchers, engineers and postgraduates in the fields of electronics systems, signal information processing and data analysis, microwave remote sensing and microwave imaging radar, as well as space technology, especially in the microwave remote sensing and airborne or space-borne microwave imaging radar fields.
Read Less
Add this copy of High-Resolution Microwave Imaging to cart. $234.84, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2019 by Springer.
Add this copy of High-Resolution Microwave Imaging to cart. $282.12, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 2019 by Springer.
Add this copy of High-Resolution Microwave Imaging to cart. $113.92, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2018 by Springer.
Add this copy of High-Resolution Microwave Imaging to cart. $234.84, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2018 by Springer.