Add this copy of In Situ Real-Time Characterization of Thin Films to cart. $44.67, new condition, Sold by Media Smart rated 4.0 out of 5 stars, ships from Hawthorne, CA, UNITED STATES, published 2000 by John Wiley & Sons.
Add this copy of In Situ Real–Time Characterization of Thin Films to cart. $62.71, good condition, Sold by Anybook rated 5.0 out of 5 stars, ships from Lincoln, UNITED KINGDOM, published 2001 by Wiley–Blackwell.
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Seller's Description:
This is an ex-library book and may have the usual library/used-book markings inside. This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 600grams, ISBN: 9780471241416.
Add this copy of In Situ Real Time Characterization of Thin Films to cart. $118.30, new condition, Sold by Books International rated 3.0 out of 5 stars, ships from Toronto, ON, CANADA, published 2000 by Wiley-Interscience.
Add this copy of In Situ Real-Time Characterization of Thin Films 2001 to cart. $169.95, new condition, Sold by textsforsale rated 4.0 out of 5 stars, ships from Houston, TX, UNITED STATES, published 2000 by Wiley-Interscience.
Add this copy of In Situ Real Time Characterization of Thin Films to cart. $178.90, Sold by Books International rated 3.0 out of 5 stars, ships from Toronto, ON, CANADA, published 2000 by Wiley-Interscience.
