Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Read Less
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $158.76, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2010 by Springer-Verlag New York Inc..
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New. Print on demand Contains: Illustrations, black & white, Illustrations, color. XVII, 357 p. 34 illus., 28 illus. in color. Intended for professional and scholarly audience.
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $224.52, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2004 by Springer.
