The focus of this book is on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques.
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The focus of this book is on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques.
Read Less
