The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical ...
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The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical characterization methods, the more specialized optical, chemical and physical methods are also covered. Contains over 1,300 references.
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Add this copy of Semiconductor Material and Device Characterization to cart. $9.83, good condition, Sold by Dream Books Co. rated 4.0 out of 5 stars, ships from Denver, CO, UNITED STATES, published 1990 by Wiley-Interscience.
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Good. Gently used with minimal wear on the corners and cover. A few pages may contain light highlighting or writing but the text remains fully legible. Dust jacket may be missing and supplemental materials like CDs or codes may not be included. May be ex-library with library markings. Ships promptly!
Add this copy of Semiconductor Material and Device Characterization to cart. $10.50, very good condition, Sold by ThriftBooks-Reno rated 5.0 out of 5 stars, ships from Reno, NV, UNITED STATES, published 1990 by Wiley-Interscience.
Add this copy of Semiconductor Material and Device Characterization to cart. $10.50, good condition, Sold by ThriftBooks-Dallas rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1990 by Wiley-Interscience.
Add this copy of Semiconductor Material and Device Characterization to cart. $10.50, good condition, Sold by ThriftBooks-Baltimore rated 5.0 out of 5 stars, ships from Halethorpe, MD, UNITED STATES, published 1990 by Wiley-Interscience.
Add this copy of Semiconductor Material and Device Characterization to cart. $10.51, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1990 by Wiley-Interscience.
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Add this copy of Semiconductor Material and Device Characterization to cart. $12.98, good condition, Sold by KuleliBooks rated 5.0 out of 5 stars, ships from Phoenix, AZ, UNITED STATES, published 1990 by Wiley-Interscience.
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Good. The book may have minor cosmetic wear (i.e. creased spine/cover, scratches, curled corners, folded pages, minor sunburn, minor water damage, minor bent). The book may have some highlights/notes/underlined pages-Accessories such as CD, codes, toys, may not be included-Safe and Secure Mailer-No Hassle Return.
Add this copy of Semiconductor Material and Device Characterization to cart. $13.65, good condition, Sold by ThriftBooks-Dallas rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1998 by Wiley-Interscience.
Add this copy of Semiconductor Material and Device Characterization to cart. $14.65, fair condition, Sold by Goodwill of Silicon Valley rated 5.0 out of 5 stars, ships from San Jose, CA, UNITED STATES, published 1990 by Wiley-Interscience.
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Fair. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing page and cover creases as well as other types visible wear such as cover tears discoloration staining marks scuffs etc. All pages intact.
Add this copy of Semiconductor Material and Device Characterization to cart. $14.85, good condition, Sold by BooksRun rated 4.0 out of 5 stars, ships from Philadelphia, PA, UNITED STATES, published 1998 by Wiley-Interscience.
Add this copy of Semiconductor Material and Device Characterization to cart. $17.70, very good condition, Sold by Goodwill Northern Illinois rated 3.0 out of 5 stars, ships from Rockford, IL, UNITED STATES, published 1998 by Wiley-Interscience.
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The book has been used but is in very good condition. There is no obvious damage to the cover and the dust jacket is included for hard covers. There are no missing or damaged pages and no underlining highlighting of text or writing in the margins.
