Mechanical behavior in thin films continues to be a growing field of interest in the materials research community. This behavior can critically influence the design, performance and reliability of thin-film structures used in every area of thin-film technology. Examples of affected areas include semiconductor and magnetic recording technology, as well as protective and hard-coating technology. As a result, it is important to study fundamental issues involved in film-substrate adhesion, the development of intrinsic stresses ...
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Mechanical behavior in thin films continues to be a growing field of interest in the materials research community. This behavior can critically influence the design, performance and reliability of thin-film structures used in every area of thin-film technology. Examples of affected areas include semiconductor and magnetic recording technology, as well as protective and hard-coating technology. As a result, it is important to study fundamental issues involved in film-substrate adhesion, the development of intrinsic stresses and the mechanisms of plastic deformation, strain relaxation, and fracture in thin films. This book addresses issues towards improving existing, as well as developing new, mechanical property characterization techniques such as more sensitive ultrasonic methods for elastic behavior determination and low-load indentation methods to investigate yield, creep, and fracture behavior. Experimental, theoretical and modelling work is presented. Topics include: novel testing methods; low-load indentation; metallization and reliability; structural and mechanical stability; surface and tribological properties; adhesion; deformation mechanisms; stresses in thin films - generation mechanisms and measurement techniques; multilayered and superlattice thin films and structure/property/processing relationships.
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Add this copy of Thin-Films-Stresses and Mechanical Properties VII: to cart. $15.00, very good condition, Sold by The Book Bin rated 5.0 out of 5 stars, ships from Salem, OR, UNITED STATES, published 1998 by Cambridge University Press.
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Seller's Description:
Very Good. > Edition/Printing: First edition | Used-VG+ cond. Very light shelf wear. Interior is crisp and clean. Ex-company lib (HP), labels to front cover, lower spine, chargeout slip to FFEP Symposium Held December 1-5, 1997, Boston, Massachusetts, U.S.A. Year 1998. 646 pp. Oversize/Overweight, No International shipping, No Expedited shipping. Standard shipping only.
