Trace Analysis and Technological Development: Special and Contributed Papers Presented at an International Symposium Held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981)
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407 pp., hardcover, ex library, else text clean & binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Add this copy of Trace Analysis and Technological Development to cart. $45.42, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1983 by Wiley.
