The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their ...
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The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.
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Add this copy of Integrated Circuit Defect-Sensitivity: Theory and to cart. $79.95, Sold by Book Forest rated 4.0 out of 5 stars, ships from San Rafael, CA, UNITED STATES, published 1992 by Springer.
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-1. Signed by author on title page. Text block firm and clean, binding unblemished, boards straight, without highlights or underlining. Well packaged and promptly shipped from California. Partnered with Friends of the Library since 2010.
Add this copy of Integrated Circuit Defect-Sensitivity: Theory and to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1992 by Springer.
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New. Print on demand Sewn binding. Cloth over boards. 167 p. Contains: Illustrations, black & white. The Springer International Engineering and Computer Science, 208.
Add this copy of Integrated Circuit Defect-Sensitivity Theory and to cart. $103.40, new condition, Sold by discount_scientific_books rated 5.0 out of 5 stars, ships from Sterling Heights, MI, UNITED STATES, published 1992 by Springer.
Add this copy of Integrated Circuit Defect-Sensitivity: Theory and to cart. $132.45, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 1992 by Springer.
