This sixth edition emphasizes staring array analysis and provides: NVIPM, TRM4, and TOD comparisons Frequency (MTF) versus spatial (pixels on target) analysis Two-dimensional versus two-directional analyses F?/d approach to modeling and system resolution In-band and out-of-band sampling artifacts Numerous trade studies
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This sixth edition emphasizes staring array analysis and provides: NVIPM, TRM4, and TOD comparisons Frequency (MTF) versus spatial (pixels on target) analysis Two-dimensional versus two-directional analyses F?/d approach to modeling and system resolution In-band and out-of-band sampling artifacts Numerous trade studies
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Add this copy of Electro-Optical Imaging System Performance (Spie Press to cart. $5.54, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1995 by Society of Photo Optical.
Edition:
2000, SPIE-International Society for Optical Engineering
Publisher:
SPIE-International Society for Optical Engineering
Published:
1995
Language:
English
Alibris ID:
18076042901
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Add this copy of Electro-Optical Imaging System Performance (Spie Press to cart. $6.04, good condition, Sold by Jenson Books Inc rated 4.0 out of 5 stars, ships from Logan, UT, UNITED STATES, published 1995 by Society of Photo Optical.
Edition:
2000, SPIE-International Society for Optical Engineering
Publisher:
SPIE-International Society for Optical Engineering
Published:
1995
Language:
English
Alibris ID:
18443575348
Shipping Options:
Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
The item is in good condition and works perfectly, however it is showing some signs of previous ownership which could include: small tears, scuffing, notes, highlighting, gift inscriptions, and library markings.
Add this copy of Electro-Optical Imaging System Performance (Spie Press to cart. $46.52, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1995 by Society of Photo Optical.
Edition:
2000, SPIE-International Society for Optical Engineering
