RF and microwave measurements are common to many disciplines and engineering areas: device and PCB characterization and testing, EMI and EMC, and signal integrity, during design, prototyping and production phases. Measurement setups and procedures are more and more complex and demanding in terms of accuracy, performance, flexibility. Methods and techniques are often borrowed from other domains, including signal processing and probability theory. Mastering the whole process has thus become challenging for the variety and ...
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RF and microwave measurements are common to many disciplines and engineering areas: device and PCB characterization and testing, EMI and EMC, and signal integrity, during design, prototyping and production phases. Measurement setups and procedures are more and more complex and demanding in terms of accuracy, performance, flexibility. Methods and techniques are often borrowed from other domains, including signal processing and probability theory. Mastering the whole process has thus become challenging for the variety and breadth of the required skills and experience. This book attacks the problem from two sides: reviewing circuits and transmission lines, signal analysis, random processes and statistics, and then considering the main experimental setup elements (cables, connectors and PCBs). Two chapters are for the Spectrum Analyzer and the Vector Network Analyzer, their settings, operation, calibration and verification. The objective is supporting R&D and test engineers, academic staff and students: references were thoroughly examined and practical examples conceived to support theory and allow autonomous repetition and verification.
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Add this copy of RF and Microwave Measurements: device characterization, to cart. $79.71, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2015 by ASTM Analysis, Simulation, Test and Measurement Sa.
Edition:
2015, ASTM Analysis, Simulation, Test and Measurement Sa
Add this copy of RF and Microwave Measurements: device characterization, to cart. $99.12, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2015 by ASTM Analysis, Simulation, Test and Measurement Sa.
Edition:
2015, ASTM Analysis, Simulation, Test and Measurement Sa
Publisher:
ASTM Analysis, Simulation, Test and Measurement Sa
Published:
2015
Language:
English
Alibris ID:
17254690938
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Add this copy of Rf and Microwave Measurements: Device Characterization, to cart. $99.13, new condition, Sold by Just one more Chapter rated 3.0 out of 5 stars, ships from Miramar, FL, UNITED STATES, published 2015 by ASTM Analysis, Simulation, Tes.
Edition:
2015, ASTM Analysis, Simulation, Test and Measurement Sa
Add this copy of Rf and Microwave Measurements: Device Characterization, to cart. $114.38, new condition, Sold by Russell Books rated 4.0 out of 5 stars, ships from Victoria, BC, CANADA, published 2015 by ASTM Analysis, Simulation, Test and Measurement Sa.
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2015, ASTM Analysis, Simulation, Test and Measurement Sa
Add this copy of Rf and Microwave Measurements: Device Characterization, to cart. $125.29, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2015 by ASTM Analysis, Simulation, Tes.
Edition:
2015, ASTM Analysis, Simulation, Test and Measurement Sa
Add this copy of Rf and Microwave Measurements: Device Characterization, to cart. $166.99, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2015 by ASTM Analysis, Simulation, Tes.
Edition:
2015, ASTM Analysis, Simulation, Test and Measurement Sa
