This book focuses on crucial characterization methods adopted for materials, design, and performance of secondary batteries. The book is divided into eight chapters aiming to provide comprehensive and essential guidance on battery characterizations. Each chapter focuses on a specific technique: electron microscopy, focused ion beam methods, atomic force microscopy, X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectra, neutron diffraction, synchrotron-radiation X-ray tomography, and ultrasonic ...
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This book focuses on crucial characterization methods adopted for materials, design, and performance of secondary batteries. The book is divided into eight chapters aiming to provide comprehensive and essential guidance on battery characterizations. Each chapter focuses on a specific technique: electron microscopy, focused ion beam methods, atomic force microscopy, X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectra, neutron diffraction, synchrotron-radiation X-ray tomography, and ultrasonic nondestructive testing. Key Features - Comprehensive coverage of characterization techniques for secondary battery technology - Explains the working principle, essential functions and data analysis for each technique - In-depth review of recent applications of secondary batteries from both material and device perspectives - Detailed reference list for advanced readers This monograph is intended as a resource for the broad research community involved in materials and device testing for batteries at academic and industrial levels. It also serves as a reference for engineering students required to learn advanced characterization techniques for developing rechargeable battery technology.
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Add this copy of Advanced Characterization Technologies for Secondary to cart. $53.95, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2024 by Bentham Science Publishers.
Add this copy of Advanced Characterization Technologies for Secondary to cart. $103.79, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2024 by Bentham Science Publishers.
Add this copy of Advanced Characterization Technologies for Secondary to cart. $139.33, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2024 by Bentham Science Publishers.
