Defects and Disorder in...
Richard Catlow (Editor)
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Yield and Variability...
Jian Cheng Zhang,
M a Styblinski
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Transition-Metal Defects in...
Michael Steger
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Point and Extended Defects in...
Giorgio Benedek (Editor)
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Defects and Properties of...
J Chikawa (Editor),
K Sumino (Editor)
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Spectroscopy of Defects in...
N.I. Ostapenko,
A. Onipko (Translator)
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The Behavior of Systems in...
R N DeWitt (Editor),
Dwight Duston (Editor)
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Electrical Insulation...
Boxue Du
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Defects and Transport in...
Robert Jaffee
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Structural Analysis of Point...
Johann-Martin Spaeth,
Jürgen R Niklas
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From Coherent Tunneling to...
Alois Würger
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Hot-Carrier Reliability of...
Yusuf Leblebici,
Sung-Mo (Steve) Kang
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Defect Complexes in...
J Giber (Editor),
F Beleznay (Editor)
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Understanding Housing Defects
Duncan Marshall
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Structure and Concentration...
Andrzej Stoklosa,
Stefan S Kurek
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Advanced Photon and Particle...
J. B. Roberto (Editor),
R. W. Carpenter (Editor)
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Defects in Sio2 and Related...
Gianfranco Pacchioni (Editor),
Linards Skuja (Editor)
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Shopping for Safety: Special...
Committee for Study of Consumer Automotive Safety Information,
National Academy of Sciences (Other primary creator)
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Latchup in CMOS Technology:...
R.R. Troutman
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Understanding Housing Defects
Duncan Marshall,
Derek Worthing
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Yield Simulation for...
D.M. Walker
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Control of Blemishes in...
William Monks
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Chloride Removal...
Jack Bennett,
Thomas J Schue
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Colour Centres and...
Peter David Townsend,
John Clive Kelly
Buy from $50.16
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