• 

  Circuit Design for Reliability

  by Ricardo Reis (Editor), Yu Cao (Editor), Gilson Wirth (Editor)

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  New Hardcover, 2014

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  Protecting Chips Against Hold Time Violations Due to Variability

  by Gustavo Neuberger, Gilson Wirth, Ricardo Reis

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  Zno Thin-Film Transistors for Cost-Efficient Flexible Electronics

  by Fßbio Fedrizzi Vidor, Gilson Inßcio Wirth, Ulrich Hilleringmann

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Additional copies that match your search:

• 1. Circuit Design for Reliability

  by Reis, Ricardo (Editor), and Cao, Yu (Editor), and Wirth, Gilson (Editor)

   
  

  

  Seller Description: New. Trade paperback (US). Glued binding. 272 p. Contains: Illustrations, black & white, Illustrations, color. See More Details

  2016, Springer ISBN-13: 9781493941568 Trade paperback, New

  Just one more Chapter AVERAGE Miramar, FL, USA

  $213.37 Add to Cart

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