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  Advances in X-Ray Analysis

  by I Cev Noyan (Editor), John V Gilfrich (Editor), Ting C Huang (Editor)

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  $76.94

  Used Hardcover, 1994

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  Advances in X-Ray Analysis: Volume 39

  by John V Gilfrich (Editor), I Cev Noyan (Editor), Ron Jenkins, MS (Editor)

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  $88.76

  New Softcover, 1998

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• 1. Advances in X-Ray Analysis: Volume 39

  by Gilfrich, John V (Editor), and Noyan, I Cev (Editor), and Jenkins, Ron, MS (Editor)

   
  

  

  Seller Description: New. Print on demand Sewn binding. Cloth over boards. 908 p. See More Details

  1998, Springer ISBN-13: 9780306458033 Hardcover, New

  Alibris BEST NV, USA

  $309.99 Add to Cart

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• 2. Advances in X-Ray Analysis: Volume 39

  by Gilfrich, John V (Editor), and Noyan, I Cev (Editor), and Jenkins, Ron, MS (Editor)

   
  

  

  Seller Description: New. Sewn binding. Cloth over boards. 908 p. See More Details

  1998, Springer ISBN-13: 9780306458033 Hardcover, New

  Ria Christie Books HIGH Uxbridge, MIDDLESEX, UNITED KINGDOM

  $345.42 Add to Cart

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