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  Metrology and Diagnostic Techniques for Nanoelectronics

  by Zhiyong Ma (Editor), David G. Seiler (Editor)

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  Used Hardcover, 2016

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  Global Well-posedness and Asymptotic Behavior of the Solutions to Non-classical Thermo(visco)elastic Models

  by Yuming Qin, Zhiyong Ma

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• 1. Metrology and Diagnostic Techniques for Nanoelectronics

  by Zhiyong Ma

   
  

  

  Seller Description: Good. Used Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK. See More Details

  2016, Jenny Stanford Publishing ISBN-13: 9789814745086 Hardcover, Good

  Paperbackshop HIGH Bensenville, IL, USA

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• 2. Metrology and Diagnostic Techniques for Nanoelectronics

  by Zhiyong Ma; Âdavid G. Seiler

   
  

  

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  CRC Press eBook ISBN: 9789814745086 Edition: 1st edition Format: EPUB eBook

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• 3. Metrology and Diagnostic Techniques for Nanoelectronics

  by Ma, Zhiyong (Editor), and Seiler, David G. (Editor)

   
  

  

  Seller Description: Fine. Contains: Illustrations, black & white, Illustrations, color. Includes: illustrations, color, illustrations, black & white. Intended for college/higher education audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. ... See More Details

  2016, Pan Stanford Publishing Pte Ltd ISBN-13: 9789814745086 Hardcover, Fine/Like New

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• 4. Metrology and Diagnostic Techniques for Nanoelectronics

  by Ma, Zhiyong (Editor), and Seiler, David G. (Editor)

   
  

  

  Seller Description: New. Contains: Illustrations, black & white, Illustrations, color. Includes: illustrations, color, illustrations, black & white. Intended for college/higher education audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over ... See More Details

  2016, Pan Stanford Publishing Pte Ltd ISBN-13: 9789814745086 Hardcover, New

  GreatBookPrices HIGH Columbia, MD, USA

  $414.92 Add to Cart

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• 5. Metrology and Diagnostic Techniques for Nanoelectronics

  by Ma, Zhiyong (Editor), and Seiler, David G. (Editor)

   
  

  

  Seller Description: New. Contains: Illustrations, black & white, Illustrations, color. Includes: illustrations, color, illustrations, black & white. Intended for college/higher education audience. See More Details

  2016, Pan Stanford Publishing Pte Ltd ISBN-13: 9789814745086 Hardcover, New

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• 6. Metrology and Diagnostic Techniques for Nanoelectronics

  by Zhiyong Ma

   
  

  

  Seller Description: New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK. See More Details

  2016, Jenny Stanford Publishing ISBN-13: 9789814745086 Hardcover, New

  Paperbackshop HIGH Bensenville, IL, USA

  $466.71 Add to Cart

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