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Additional copies that match your search:
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1. Electronic Design Automation: Synthesis, Verification, and Test (Systems on Silicon)
by Wang, Laung-Terng [Editor]; Chang, Yao-Wen [Editor]; Cheng, Kwang-Ting (Tim) [Editor];
Seller Description: Good. USED-VARIOUS AMOUNTS OF WEAR-POSSIBLE HIGHLIGHTS-WE CANNOT GUARANTEE SUPPLEMENTS SUCH AS CD, ACCESS CODE, OR INFO TRAC. See More Details
2009, Morgan Kaufmann
ISBN-13: 9780123743640
Hardcover, Good
Midland Park, NJ, USA
$208.01
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2. Vlsi Test Principles and Architectures: Design for Testability
by Wang, Laung-Terng
Seller Description: VERY GOOD in VERY GOOD jacket. See More Details
2006, Morgan Kaufmann
ISBN-13: 9781493300860
paperback, Very Good
NIAGARA FALLS, NY, USA
$266.85
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3. Vlsi Test Principles and Architectures: Design for Testability
by Wang, Laung-Terng
Seller Description: NEW in NEW jacket. See More Details
2006, Morgan Kaufmann
ISBN-13: 9781493300860
paperback, New
NIAGARA FALLS, NY, USA
$269.85
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4. Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng
Seller Description: VERY GOOD in VERY GOOD jacket. See More Details
2006, Morgan Kaufmann
ISBN-13: 9780123705976
Hardcover, Very Good
NIAGARA FALLS, NY, USA
$281.85
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5. Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng
Seller Description: NEW in NEW jacket. See More Details
2006, Morgan Kaufmann
ISBN-13: 9780123705976
Hardcover, New
NIAGARA FALLS, NY, USA
$284.85
