VLSI Test Principles and...
Laung-Terng Wang,
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Fundamentals of Semiconductor...
Gary S May,
Costas J Spanos
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Lumped Element Quadrature...
David Andrews
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Fully-Depleted Soi CMOS...
Takayasu Sakurai,
Akira Matsuzawa
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High-Speed Optical...
Yuyu Liu (Editor),
Huazhong Yang (Editor)
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Eda for IC Implementation,...
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Louis Scheffer (Editor)
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Writing Testbenches Using...
Janick Bergeron
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Handbook of Semiconductor...
Geraldine Cogin Shwartz,
Geraldine C Schwartz (Editor)
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Analog Circuit Design: RF...
Michiel Steyaert (Editor),
Arthur H M van Roermund (Editor)
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Design of High-Speed...
Ramesh Harjani (Editor)
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Electromagnetic Compatibility...
Sonia Ben Dhia (Editor),
Mohamed Ramdani (Editor)
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Transaction-Level Modeling...
Frank Ghenassia (Editor)
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Managing Power Electronics:...
Nazzareno Rossetti
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Leakage in Nanometer CMOS...
Siva G Narendra (Editor),
Anantha P Chandrakasan (Editor)
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Fault Diagnosis of Analog...
Prithviraj Kabisatpathy,
Alok Barua
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RF Systems, Components, and...
Ferril Losee
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Verification Methodology...
Janick Bergeron,
Eduard Cerny
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Low-Power Processors and...
Christian Piguet (Editor)
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Photomask Fabrication...
Benjamin G Eynon,
Banqiu Wu
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Integrated Circuit Test...
Ian A Grout
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Foundations of Analog and...
Anant Agarwal,
Jeffrey Lang
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Functional Verification of...
Prabhat Mishra,
Nikil D Dutt
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Comprehensive Functional...
Bruce Wile,
John Goss
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Semiconductor Manufacturing...
Hwaiyu Geng,
Geng Hwaiyu
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