-
Recommended Copy
-
Recommended Copy
-
-
-
-
Recommended Copy
-
Eligible for
Additional copies that match your search:
-
1. Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology
by Seiler, David G (Editor), and Diebold, Alain C (Editor), and Shaffner, Thomas J (Editor)
Seller Description: New. AIP Conference Proceedings (Numbered), 683. See More Details
2003, American Institute of Physics
ISBN-13: 9780735401525
Other, New
Miramar, FL, USA
$327.37
-
2. Characterization and Metrology for Ulsi Technology 2000: International Conference (Aip Conference Proceedings, 550)
by Alain C. Diebold D. G. Seiler David G. Seiler
Seller Description: Fair. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing page and cover creases as well as other types visible wear such as cover tears discoloration staining marks scuffs etc. All pages intact. See More Details
2001, American Institute of Physics
ISBN-13: 9781563969676
Hardcover, Fair
San Jose, CA, USA
$341.17
-
3. Handbook of Silicon Semiconductor Metrology
by Diebold, Alain C. [Editor]
Seller Description: New. Size: 10x7x1; In shrink wrap. Looks like an interesting title! See More Details
2001, CRC Press
ISBN-13: 9780824705060
Hardcover, New
North Las Vegas, NV, USA
$413.48
-
4. Handbook of Silicon Semiconductor Metrology
by Diebold, Alain C (Editor)
Seller Description: New. Print on demand Sewn binding. Cloth over boards. 894 p. See More Details
2001, CRC Press
ISBN-13: 9780824705060
Hardcover, New
NV, USA
$422.73
-
5. Handbook of Silicon Semiconductor Metrology
by Diebold, Alain C (Editor)
Seller Description: New. Sewn binding. Cloth over boards. 894 p. See More Details
2001, CRC Press
ISBN-13: 9780824705060
Hardcover, New
Southport, MERSEYSIDE, UNITED KINGDOM
$432.69
-
6. Handbook of Silicon Semiconductor Metrology
by Diebold, Alain C (Editor)
Seller Description: Fine. Sewn binding. Cloth over boards. 894 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
2001, CRC Press
ISBN-13: 9780824705060
Hardcover, Fine/Like New
Columbia, MD, USA
$464.10
-
7. Handbook of Silicon Semiconductor Metrology
by Diebold, Alain C (Editor)
Seller Description: New. Sewn binding. Cloth over boards. 894 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
2001, CRC Press
ISBN-13: 9780824705060
Hardcover, New
Columbia, MD, USA
$464.10
