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1. Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology
by Seiler, David G (Editor), and Diebold, Alain C (Editor), and Shaffner, Thomas J (Editor)
Seller Description: New. AIP Conference Proceedings (Numbered), 683. See More Details
2003, American Institute of Physics
ISBN-13: 9780735401525
Other, New
Miramar, FL, USA
$327.37
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2. Characterization and Metrology for Ulsi Technology 2000: International Conference (Aip Conference Proceedings, 550)
by Alain C. Diebold D. G. Seiler David G. Seiler
Seller Description: Fair. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing page and cover creases as well as other types visible wear such as cover tears discoloration staining marks scuffs etc. All pages intact. See More Details
2001, American Institute of Physics
ISBN-13: 9781563969676
Hardcover, Fair
San Jose, CA, USA
$341.17
