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  Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology

  by David G Seiler (Editor), Alain C Diebold (Editor), Thomas J Shaffner (Editor)

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• 1. Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology

  by Seiler, David G (Editor), and Diebold, Alain C (Editor), and Shaffner, Thomas J (Editor)

   
  

  

  Seller Description: New. AIP Conference Proceedings (Numbered), 683. See More Details

  2003, American Institute of Physics ISBN-13: 9780735401525 Other, New

  Just one more Chapter AVERAGE Miramar, FL, USA

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